

Documentation
The Survelase Mega combines all the features of Global Laser Solutions LTD’s Survelase Maxi with the addition of a longer focal length lens to allow improved beam divergence and produce smaller focused spots over a wide working distance.
The Survelase Mega is a long-distance targeting laser diode module that produces a small well-defined spot up to 185m away. The high quality output beam afforded by the Survelase is beneficial in range-finding, positioning, surveying, or general measurement applications involving large working distances.
Wavelengths of green (520nm) and red (635, 650nm) are available with output powers up to 50mW. The green model emits light that appears more than 2X brighter to the human eye than the equivalent power in 635nm. As a result, you’re more likely to see these projections against dark materials or in high ambient light levels (e.g. daylight).
The LC version allows you to control the output intensity linearly by applying a voltage of between 0 to 1 volts, to the control input. The output intensity will faithfully replicate any arbitrary signal you wish to apply within the limits of the laser diode module’s maximum rise and fall time.
The PWM version allows you to use pulse width modulation of the output intensity from a TTL level input signal, again within the limits of the laser diode module’s maximum rise and fall time. You can therefore control the mean intensity of the laser beam simply by changing the mark to space ratio or modulate the laser with coded information.
A user-adjustable focus is another optional feature of the Survelase Maxi. A focus key (purchased separately) allows you to focus the laser as required in your application without removing the internal collimating optic. This provides flexibility, ease-of-use, and allows you to maintain the specified laser classification.
A comprehensive range of accessories including mounting clamps, rail systems, laser safety glasses and enhancement glasses are also available to complement the Survelase Mega.
Applications
– Surveying
– Targeting
– Positioning
– Measurement
– Alignment